28 results
Spatially Resolved Characterization of Electromigration-Induced Plastic Deformation in al (0.5WT% CU) Interconnect
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- Journal:
- MRS Online Proceedings Library Archive / Volume 738 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, G13.1
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- 2002
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Microtexture and Strain in Electroplated Copper Interconnects
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D10.3.1
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- 2000
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Grain Orientation and Strain Measurements in Sub-Micron wide Passivated Individual Aluminum Test Structures
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- MRS Online Proceedings Library Archive / Volume 612 / 2000
- Published online by Cambridge University Press:
- 17 March 2011, D8.8.1
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- 2000
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The Effects of Environment and Fatigue on the Adhesion and Subcritical Debonding of Dielectric Polymers
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- MRS Online Proceedings Library Archive / Volume 565 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 123
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- 1999
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Electromigration Voiding in Argon-Implanted Interconnects
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- MRS Online Proceedings Library Archive / Volume 563 / 1999
- Published online by Cambridge University Press:
- 10 February 2011, 97
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- 1999
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Thin Film Stress Measurement with a Tunneling Sensor
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- MRS Online Proceedings Library Archive / Volume 546 / 1998
- Published online by Cambridge University Press:
- 10 February 2011, 45
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- 1998
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A High Voltage Scanning Electron Microscope for the In-SituObservation and Recording of Electromigration Voids in Metal Lines on Integrated Circuits.
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- Journal:
- Microscopy and Microanalysis / Volume 3 / Issue S2 / August 1997
- Published online by Cambridge University Press:
- 02 July 2020, pp. 615-616
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- August 1997
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Determination Of Temperature Dependent Unstressed Lattice Spacings In Crystalline Thin Films On Substrates
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- Journal:
- MRS Online Proceedings Library Archive / Volume 505 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 527
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- 1997
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Comparison of Stresses in Al Lines Under Various Passivations
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- MRS Online Proceedings Library Archive / Volume 473 / 1997
- Published online by Cambridge University Press:
- 10 February 2011, 415
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- 1997
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Finite Element Modeling Of Grain Aspect Ratio And Strain Energy Density In A Textured Copper Thin Film
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- MRS Online Proceedings Library Archive / Volume 428 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 481
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- 1996
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Finite Element Modeling of Grain Aspect Ratio and Strain Energy Density in a Textured Copper Thin Film
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- MRS Online Proceedings Library Archive / Volume 436 / 1996
- Published online by Cambridge University Press:
- 15 February 2011, 411
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- 1996
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The Influence of Strain Energy Minimization on Abnormal Grain Growth in Copper Thin Films
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- MRS Online Proceedings Library Archive / Volume 391 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 103
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- 1995
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Microstructural Characterization of Copper Thin Films on Metallic Underlayers
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- MRS Online Proceedings Library Archive / Volume 338 / 1994
- Published online by Cambridge University Press:
- 22 February 2011, 307
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- 1994
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Effect of Copper Film Thickness on Stress and Strain in Grains of Different Orientation
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- MRS Online Proceedings Library Archive / Volume 356 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 459
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- 1994
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Measurement of the Dependence of Stress and Strain on Crystallographic Orientation in Cu and Al thin Films
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- MRS Online Proceedings Library Archive / Volume 356 / 1994
- Published online by Cambridge University Press:
- 21 February 2011, 429
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- 1994
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Transmission Electron Microscopy and X-Ray Diffraction Studies of a,b-Axis Oriented YBa2Cu3O7-δ Films
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- MRS Online Proceedings Library Archive / Volume 275 / 1992
- Published online by Cambridge University Press:
- 26 February 2011, 771
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- 1992
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Oxidation Kinetics of Yba2Cu3OT7-x Thin Films in the Presence of Atomic Oxygen and Molecular Oxygen by In-Situ Resistivity Measurement
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- MRS Online Proceedings Library Archive / Volume 230 / 1991
- Published online by Cambridge University Press:
- 15 February 2011, 333
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- 1991
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Barrier Height Reduction at the Pd-Ge/n-GaAs Interface
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- MRS Online Proceedings Library Archive / Volume 240 / 1991
- Published online by Cambridge University Press:
- 26 February 2011, 485
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- 1991
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Morphology and Defect Structure of Sputtered High-Quality In-Situ YBa2Cu3O7−δ Films
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- MRS Online Proceedings Library Archive / Volume 183 / 1990
- Published online by Cambridge University Press:
- 21 February 2011, 363
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- 1990
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Investigation of Thin Pd-Ge Layer Formation Using Synchrotron Vacuum Ultraviolet Photoemission Spectroscopy
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- MRS Online Proceedings Library Archive / Volume 181 / 1990
- Published online by Cambridge University Press:
- 25 February 2011, 265
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- 1990
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